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Flag Smut Reaction in Wheat: Its Genetic Control and Associations with Other Traits¹

The reaction to flag smut [Urocystis agropyri (Preuss) Schroet.] of F₃ and F₄ lines of 10 wheat (Triticum aestivum L. em Thell.) crosses involving the parents ‘Spinkcota’, ‘lowin’ (highly resistant); ‘Games’, ‘Hurt’, ‘Golden’, ‘Dickson 114’ (resistant); ‘Ridit’ (moderately resistant); and CI 13749 (susceptible) was studied in a field near Bickleton, Wash. Segregation ratios in five crosses between highly resistant and resistant parents suggested that different large-effect genes governed resistance to flag smut; no completely susceptible lines were recovered, which indicated that the parental combinations tested had one or more small-effect genes for resistance in common with one another. Evidence suggested that lowin has two large-effect genes for resistance that differ from those possessed by Spinkcota, Dickson 114, and Gaines. Ridit probably has one gene for moderate resistance that is not common to Spinkcota, Dickson 114, and Gaines. The segregation patterns for reaction of two crosses involving the susceptible parent, CI 13749, suggested complementary resistance. Results indicated that a minimum of four different large-effect and three small-effect genes for flag smut resistance were represented among the eight parents studied. No associations were found between percentage of flag smut and plant height, stripe rust reaction, maturity, and spike type. Percentage of flag smut was associated with chaff color in two of seven crosses and with awn expression in one of five crosses.

Key Words: Vertical and Horizontal resistance • Transgressive segregation • Triticum aestivum L. em Thell. • Host-parasite-genetic interactions • Resistance to flag smut

² Geneticist, ARS-USDA, Pullman, WA 99163.

Received for publication August 6, 1975.